Estimate the Meaning-Time-To-Failure of LED driver using Numerical simulation

  • Cơ quan:
    1 Faculty of Civil Engineering, Hanoi University of Mining and Geology, Vietnam
    2 Technical Support Manager, Advanced Technology Joint Stock Company, Vietnam
  • Từ khóa: Electro-thermal,LED driver,Meaning-Time-To-Failure, MTTF.
  • Nhận bài: 15-06-2021
  • Chấp nhận: 26-10-2021
  • Đăng online: 31-12-2021
Trang: 64 - 71
Lượt xem: 370

Tóm tắt:

The Meaning-Time-To-Failure (MTTP), also known as Electromigration Analysis is an estimation of product life. Light-Emitting Diodes (LEDs) are usually driven by constant current switched-mode power supplies, which are invented early than LEDs for lighting applications. While LEDs themselves are extremely reliable and have a long lifetime, the electronic LED drivers in experiment usually fail due to overheating causing Printed Circuit Boards (PCBs) explosion, inability provide current/voltage input to the LEDs over their whole lifetime. This paper proposes a numerical simulation method to predict fault location on PCB of LED driver based on 2-way coupling electro-thermal multiphysic analysis, then applies the analytic models to calculate the time to failure of the points on PCB of LED drivers. The procedures can be applied to assist managers in assessing risk and making LED-based lighting system reliability decisions.

Trích dẫn
Si Tien Nguyen và An Dinh Pham, 2021. Estimate the Meaning-Time-To-Failure of LED driver using Numerical simulation, Tạp chí Khoa học kỹ thuật Mỏ - Địa chất, số 62, kỳ 6, tr. 64-71.
Tài liệu tham khảo

[1]. J. Huang, D. S. Golubovic, S. Koh, D. Yang, X. Li, X. J. Fan, and G. Q. Zhang, (2015). Degradation mechanisms of mid-power white-light LEDs under high-temperature-humidity conditions. IEEE Transactions on Device and Materials Reliability 15(2), 220-228.

[2]. F. Haghighi and S. J. Bae, (2015). Reliatbility estimation from linear degradation and failure time data with competing risks under a step-stress accelerated degradation test. IEEE Transactions on Reliability 64(3), 960-971.

[3]. C. Quian, X. J. Fan, C. Yuan, and G. Q. Zhang, (2016). An accelerated test method of luminous flux depreciation for LED luminaires and lamps. Reliability Engineering & System Safety 147, 84-92.

[4]. R. Wu, F. Blaabejerg, H. Wang, and M. Liserre, (2013). Overview of catastrophic failures of freewheeling diodes in power electronic circuits. Microelectronics Reliability 53(9-11), 1788-1792.

[5]. S. Lan, C. M. Tan, and K. Wu., (2014). Methodology of reliability enhancement for high power LED driver. Microelectronics Reliability 53(6-7), 1150-1159.

[6]. Black, J. R., (1969). Electromigration – A Brief Survey and Some Recent Results. IEEE Transactions on Electron Devices. 16(4), 338-347.

[7]. R. L. de Orio, H. Ceric, (2010). Physically based models of electromigration: From Black’s equation to modern TCAD models. Microelectronics Reliability journal

[8]. W. D. van Driel and X. J, Fan, (2012). Solid state lighting reliability: components to system. Springer. New York, 628 pages

[9]. Pradeep Lall, Peter Sakalaukus, and Lynn Davis, (2015). Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging. IEEE. Translations and content mining are permitted for academic research only. IEEE Access (3), 2169-3536

[10]. Michael Riebling, Philips Hadco and OptoElectronix David Szombatfalvy, (2011). LED Luminaire Lifetime: Recommendations for Testing and Reporting Solid-State Lighting Product Quality Initiative Third. Next Generation Lighting Industry Alliance (NGLIA) formed SSL Quality Advocates and a Reliability and Lifetime Working Group, 35 pages.